Focused Ion Beam / Scanning Electron Microscope Specialist

Job Description

College of Science and Engineering
School of Physics and Astronomy

Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Specialist
Vacancy Reference: 171932
Grade 7: £40,497 – £45,413 per annum

The University of Glasgow, a world top 100 institution and ranked 13th globally in the Times Higher Education World Impact Rankings 2023, continues its tradition of innovation and excellence built over more than 574 years.

We are seeking a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Specialist to join the School of Physics & Astronomy on a permanent, full-time basis.

In this role, you will provide expert technical leadership and day-to-day management of FIB/SEM facilities within the Materials & Condensed Matter Physics (MCMP) Group and the Kelvin Nanocharacterisation Centre (KNC). Your responsibilities will include operating advanced FIB/SEM systems, with a focus on sample preparation for Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). You will play a key role in ensuring the safe and effective use of these resources, aligning with the strategic goals of the MCMP group and the College’s Instrumentation Services.

Further information:

MCMP Research Group

Kelvin Nanocharacterisation Centre

This is a full-time (35 hours/week), open-ended position. Relocation support is available where appropriate.

Right to Work in the UK:
Applicants must be eligible to live and work in the UK. This role may qualify for sponsorship under the Skilled Worker visa route, subject to eligibility and tradeable points criteria. More info:

College of Science and Engineering
School of Physics and Astronomy

Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Specialist
Vacancy Reference: 171932
Grade 7: £40,497 – £45,413 per annum

The University of Glasgow, a world top 100 institution and ranked 13th globally in the Times Higher Education World Impact Rankings 2023, continues its tradition of innovation and excellence built over more than 574 years.

We are seeking a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) Specialist to join the School of Physics & Astronomy on a permanent, full-time basis.

In this role, you will provide expert technical leadership and day-to-day management of FIB/SEM facilities within the Materials & Condensed Matter Physics (MCMP) Group and the Kelvin Nanocharacterisation Centre (KNC). Your responsibilities will include operating advanced FIB/SEM systems, with a focus on sample preparation for Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). You will play a key role in ensuring the safe and effective use of these resources, aligning with the strategic goals of the MCMP group and the College’s Instrumentation Services.

Further information:

MCMP Research Group

Kelvin Nanocharacterisation Centre

This is a full-time (35 hours/week), open-ended position. Relocation support is available where appropriate.

Right to Work in the UK:
Applicants must be eligible to live and work in the UK. This role may qualify for sponsorship under the Skilled Worker visa route, subject to eligibility and tradeable points criteria. More info: Skilled Worker visa

Informal enquiries:
Contact William Smith: William.Smith@glasgow.ac.uk